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integrated circuit test meaning in Chinese

集成电路测试

Examples

  1. Methods of expanding the element storehouse of integrated circuit test system
    集成电路测试系统的元件库的扩充方法
  2. We have demonstrated that the integrated circuit test structures fabricated at standard commercial foundries can be radiation tolerant at total does greater than 100krad ( si ) . the radiation environment of outer space is capable of effecting cmos devices in three ways
    外太空辐射环境主要以三种方式影响cmos器件:总剂量辐射效应( tid ) ,单粒子翻转效应( seu )和单粒子闩锁效应( sel ) 。
  3. In this study , the design procedures for mitigating radiation effects mechanisms have been implemented in a gate array design , we have obtained samples of integrated circuits test structures manufactured by wuxi csmc - hj using their 0 . 6 - m cmos process
    在研究中,我们将降低辐射效应的设计方法应用到门阵列设计中,获得了华晶上华半导体有限公司采用0 . 6 m的cmos工艺生产的集成电路样片,具有100krad ( si )的抗总剂量辐射能力。
  4. At present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely . in order to improve the fault coverage of the testing to meet the demands of people , the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s
    90年代中期,人们提出了瞬态电流测试方法( iddt ) ,以便发现一些其他测试方法所不能发现的故障,进一步从总体上提高测试的故障覆盖率,满足人们对高性能集成电路的需要。

Related Words

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  14. integrated circuit test system
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