integrated circuit test meaning in Chinese
集成电路测试
Examples
- Methods of expanding the element storehouse of integrated circuit test system
集成电路测试系统的元件库的扩充方法 - We have demonstrated that the integrated circuit test structures fabricated at standard commercial foundries can be radiation tolerant at total does greater than 100krad ( si ) . the radiation environment of outer space is capable of effecting cmos devices in three ways
外太空辐射环境主要以三种方式影响cmos器件:总剂量辐射效应( tid ) ,单粒子翻转效应( seu )和单粒子闩锁效应( sel ) 。 - In this study , the design procedures for mitigating radiation effects mechanisms have been implemented in a gate array design , we have obtained samples of integrated circuits test structures manufactured by wuxi csmc - hj using their 0 . 6 - m cmos process
在研究中,我们将降低辐射效应的设计方法应用到门阵列设计中,获得了华晶上华半导体有限公司采用0 . 6 m的cmos工艺生产的集成电路样片,具有100krad ( si )的抗总剂量辐射能力。 - At present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely . in order to improve the fault coverage of the testing to meet the demands of people , the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s
90年代中期,人们提出了瞬态电流测试方法( iddt ) ,以便发现一些其他测试方法所不能发现的故障,进一步从总体上提高测试的故障覆盖率,满足人们对高性能集成电路的需要。
Related Words
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- integrated circuit test system